Full flow: crystal growth → front end → back end
▶ Slide viewA general flow compiled from public textbooks, industry data, and news reports; actual steps and recipes vary by fab.
Click a tab to switch charts. Details: crystal growth, front end, back end.
Silicon wafers: crystal growth to polished wafer
Where chips begin: 11-nines polysilicon is melted and pulled (CZ) into a 300 mm, 2 m ingot, then sliced, lapped and polished flat. SiC wafers grow by PVT at fractions of a mm per hour — why they're costly.
34 steps (repeats counted once)
NewsAI is lifting demand for 300 mm wafers; SiC is moving from 6- to 8-inch for EVs and chargers.
One row per module; follow the blue arrows. Click a box for details.
- Polysilicon feedstockSteps 1–4
- 1Polysilicon intake11N purity
- 2Feedstock cleanAcid etch
- 3Dopant weighingBoron or phosphorus
- 4Load quartz crucible
- Crystal growthSteps 5–12
- 5Vacuum · argonPuller
- 6Melting~1420 °C
- 7Seed dipping
- 8NeckingClears dislocations
- 9ShoulderingDiameter grows to 300 mm
- 10Body growthMain ingot, about 2 m long
- 11Tailing
- 12Cool · remove ingot
- Ingot processingSteps 13–16
- 13Ingot checkResistivity · O₂ · defects
- 14Crop · section
- 15OD grinding
- 16Orientation notchNotch
- Slicing and shapingSteps 17–22
- 17Wire sawingDiamond wire
- 18Clean · demount
- 19Edge chamferPrevents chipping
- 20Double-side lappingLapping / Grinding
- 21EtchingRemoves damage
- 22Donor-killer annealDonor Killer
- PolishingSteps 23–25
- 23Double-side polishDSP
- 24Edge polishing
- 25Final polishOne side
- Clean & inspectSteps 26–30
- 26Final cleaningRCA clean
- 27Flatness
- 28Particles
- 29EpitaxyEpi only
- 30Epi checkEpi only
- ShippingSteps 31–34
- 31Outgoing QCLook · defects · data
- 32Load wafer shipping boxFOSB
- 33Vacuum dry packBag + desiccant
- 34To the fabWafer fab next
- ✓ Polished wafers to the fab
Advanced logic (3 / 2 nm class, GAA nanosheet transistors)
Compute chips for CPUs, GPUs, phones and AI. Shown with GAA nanosheets; FinFET is similar, minus the nanosheet steps. Dozens of masks, 10+ metal layers.
67 steps (repeats counted once)
NewsTSMC N3 powers the latest Apple and NVIDIA chips; N2 moves to GAA nanosheets, in volume since 2H 2025.
One row per module; follow the blue arrows. Orange dashed boxes repeat (count shown). Click for details.
- Wafer preparationSteps 1–5
- 1Wafer intake300 mm wafers
- 2Incoming inspectionFlatness · defects
- 3Laser markingWafer ID
- 4Initial wet cleanRCA clean
- 5Load into FOUPFOUP from here on
- Fins and isolationSteps 6–15
- 6Si/SiGe epi stackFor GAA nanosheets
- 7Hard mask deposition
- 8LithographyTrack + scanner
- 9CD · overlayCD-SEM / overlay
- 10Fin etchDry plasma etch
- 11Resist strip · cleanAshing + wet clean
- 12STI fillSTI: oxide deposition
- 13CMP planarization
- 14Post-CMP clean
- 15Fin revealOxide etch-back
- Well implantSteps 16–19
- ↻ Repeat × several (wells, Vt)
- 16LithographyTrack + scanner
- 17Ion implantationN-well / P-well
- 18Resist strip · cleanAshing + wet clean
- 19Rapid thermal annealRTA: dopant activation
- ↻ Repeat × several (wells, Vt)
- Dummy gate and spacersSteps 20–25
- 20Gate oxide · polyDummy gate
- 21LithographyTrack + scanner
- 22CD · overlayCD-SEM / overlay
- 23Gate etch
- 24Resist strip · cleanAshing + wet clean
- 25Spacer dep & etchSpacer
- Source / drainSteps 26–30
- 26Source/drain recess
- 27Inner spacerIsolates nanosheets
- 28CleanPre-epi clean
- 29Source/drain epitaxyPMOS SiGe / NMOS SiP
- 30Laser anneal
- Replacement metal gateSteps 31–37
- 31ILD deposition · CMPILD0
- 32Dummy gate removal
- 33Nanosheet releaseSelective SiGe etch
- 34Clean
- 35High-k gate dielectricALD: HfO₂
- 36Work-function metalALD: sets Vt
- 37Gate metal fill · CMP
- ContactsSteps 38–46
- 38Dielectric deposition
- 39LithographyTrack + scanner
- 40CD · overlayCD-SEM / overlay
- 41Contact etch
- 42Resist strip · cleanAshing + wet clean
- 43Silicide formationLower resistance
- 44Contact metal fillTungsten or cobalt
- 45CMP planarization
- 46Post-CMP clean
- Metal interconnectSteps 47–56
- ↻ Repeat × 12–15 layers
- 47Low-k depositionLow-k
- 48EUV or multi-patterningEUV for finest layers
- 49CD · overlayCD-SEM / overlay
- 50Trench · via etchDual damascene
- 51Resist strip · cleanAshing + wet clean
- 52Barrier · Cu seedPVD
- 53Copper electroplating
- 54Copper CMP
- 55Post-CMP clean
- 56Defect inspection
- ↻ Repeat × 12–15 layers
- Top metal & passivationSteps 57–61
- 57Thick metal · Al pads
- 58Passivation depositionSiN · SiO₂
- 59LithographyTrack + scanner
- 60Pad open etchPad open
- 61Resist strip · cleanAshing + wet clean
- Wafer testSteps 62–63
- 62Wafer acceptance testWAT: scribe-line tests
- 63Wafer probeCP: per-die test
- ShippingSteps 64–67
- 64Outgoing inspectionLook · defects · data
- 65Into FOSBFOSB
- 66Vacuum dry packBag + desiccant, sealed
- 67Ship to OSATContinues to back end
- ✓ Wafers to the OSAT
DRAM (1β nm class)
Main memory for PCs and phones, and the basis of HBM. Each cell is one transistor + one capacitor: buried word line, bit line above, tall capacitor on top. HBM wafers also get TSVs for stacking.
60 steps (repeats counted once)
NewsAI servers eat HBM, so memory makers shift DRAM capacity to it — and prices rise.
One row per module; follow the blue arrows. Orange dashed boxes repeat (count shown). Click for details.
- Wafer preparationSteps 1–5
- 1Wafer intake300 mm wafers
- 2Incoming inspectionFlatness · defects
- 3Laser markingWafer ID
- 4Initial wet cleanRCA clean
- 5Load into FOUPFOUP from here on
- Active area & isolationSteps 6–14
- 6Hard mask deposition
- ↻ Multi-patterning × 2–4
- 7LithographyTrack + scanner
- 8Etch · spacer transferSAQP patterning
- 9CD · overlayCD-SEM / overlay
- 10Active area etch
- 11Resist strip · cleanAshing + wet clean
- 12STI fillSTI
- 13CMP planarization
- 14Post-CMP clean
- Buried word lineSteps 15–20
- 15LithographyTrack + scanner
- 16Word line trench etch
- 17Resist strip · cleanAshing + wet clean
- 18Gate oxidation
- 19Gate metal fillTiN / W
- 20Recess · cap
- Bit lineSteps 21–28
- 21LithographyTrack + scanner
- 22Bit line contact etch
- 23Resist strip · cleanAshing + wet clean
- 24Bit line metal
- 25LithographyTrack + scanner
- 26Bit line etch
- 27Resist strip · cleanAshing + wet clean
- 28Spacer deposition
- Storage capacitorSteps 29–37
- 29Storage node contactSNC
- 30Capacitor moldHigh aspect ratio
- 31LithographyTrack + scanner
- 32Capacitor hole etchAspect ratio above 50
- 33Resist strip · cleanAshing + wet clean
- 34Bottom electrodeTiN
- 35Mold removalWet etch
- 36Capacitor dielectricALD: high-k material
- 37Top electrode
- Peripheral transistorsSteps 38–42
- ↻ Repeat × several (N, P)
- 38LithographyTrack + scanner
- 39Ion implantation
- 40Resist strip · cleanAshing + wet clean
- 41Peripheral gate
- 42Rapid thermal annealRTA
- ↻ Repeat × several (N, P)
- Metal interconnectSteps 43–49
- ↻ Repeat per layer × 3–4
- 43Dielectric deposition
- 44LithographyTrack + scanner
- 45Trench · via etch
- 46Resist strip · cleanAshing + wet clean
- 47Metal depositionW / Cu / Al
- 48CMP planarization
- 49Post-CMP clean
- ↻ Repeat per layer × 3–4
- PassivationSteps 50–53
- 50Passivation deposition
- 51LithographyTrack + scanner
- 52Pad open etch
- 53Resist strip · cleanAshing + wet clean
- Wafer testSteps 54–56
- 54Wafer acceptance testWAT: scribe-line tests
- 55Laser repairSwap in spare cells
- 56Wafer probeCP: per-die test
- ShippingSteps 57–60
- 57Outgoing inspectionLook · defects · data
- 58Into FOSBFOSB
- 59Vacuum dry packBag + desiccant, sealed
- 60Ship to OSATContinues to back end
- ✓ Wafers to the OSAT
3D NAND flash (200+ layers)
Storage for SSDs and phones. Cells stacked 200+ layers high: deposit hundreds of films, then etch deep holes in one pass. Periphery often sits under the array (CuA) or on a bonded wafer.
54 steps (repeats counted once)
NewsAI data centers drive enterprise SSDs; layers push past 300.
One row per module; follow the blue arrows. Orange dashed boxes repeat (count shown). Click for details.
- Wafer preparationSteps 1–5
- 1Wafer intake300 mm wafers
- 2Incoming inspectionFlatness · defects
- 3Laser markingWafer ID
- 4Initial wet cleanRCA clean
- 5Load into FOUPFOUP from here on
- Peripheral transistorsSteps 6–13
- ↻ Repeat × several
- 6LithographyTrack + scanner
- 7Ion implantation
- 8Resist strip · cleanAshing + wet clean
- 9Peripheral gate
- 10Rapid thermal annealRTA
- 11Lower metal
- 12CMP planarization
- 13Post-CMP clean
- ↻ Repeat × several
- Multilayer film stackSteps 14–15
- ↻ Alternate × 200–300 layers
- 14SiO₂ deposition
- 15SiN deposition
- ↻ Alternate × 200–300 layers
- Channel holesSteps 16–24
- ↻ Stacked in 2–3 decks
- 16Hard mask deposition
- 17LithographyTrack + scanner
- 18CD · overlayCD-SEM / overlay
- 19Channel hole etchAspect ratio above 60
- 20Resist strip · cleanAshing + wet clean
- 21Charge-trap layerONO
- 22Channel poly
- 23Hole fill · CMP
- 24Post-CMP clean
- ↻ Stacked in 2–3 decks
- StaircaseSteps 25–29
- ↻ Trim + etch × dozens
- 25LithographyTrack + scanner
- 26Staircase etch
- 27Resist trim
- 28Resist strip · cleanAshing + wet clean
- 29Dielectric fill · CMP
- ↻ Trim + etch × dozens
- Gate replacementSteps 30–35
- 30LithographyTrack + scanner
- 31Slit etch
- 32Resist strip · cleanAshing + wet clean
- 33SiN removalHot phosphoric etch
- 34Tungsten word lines
- 35Slit fill
- Contacts & metalSteps 36–48
- 36LithographyTrack + scanner
- 37Staircase contact etchVarying depths
- 38Resist strip · cleanAshing + wet clean
- 39Contact metal fill
- ↻ Repeat per layer × 2–3
- 40Dielectric deposition
- 41LithographyTrack + scanner
- 42Trench · via etch
- 43Resist strip · cleanAshing + wet clean
- 44Metal deposition
- 45CMP planarization
- 46Post-CMP clean
- 47Passivation deposition
- 48Pad open etch
- Wafer testSteps 49–50
- 49Wafer acceptance testWAT: scribe-line tests
- 50Wafer probeCP: per-die test
- ShippingSteps 51–54
- 51Outgoing inspectionLook · defects · data
- 52Into FOSBFOSB
- 53Vacuum dry packBag + desiccant, sealed
- 54Ship to OSATContinues to back end
- ✓ Wafers to the OSAT
Power devices (trench MOSFET / IGBT)
Power switches for EVs, chargers, inverters and motors. Trench MOSFET shown: current runs vertically, so the back gets metal too. IGBTs add a backside implant; SiC needs 1600 °C+ activation. Mostly 200/150 mm fabs.
41 steps (repeats counted once)
NewsEVs and AI power supplies drive SiC and GaN; Taiwan is adding 200 mm capacity.
One row per module; follow the blue arrows. Click a box for details.
- Wafer preparationSteps 1–5
- 1Epi wafer intakeN⁺ substrate + N⁻ epi
- 2Incoming inspection
- 3Laser markingWafer ID
- 4Initial wet cleanRCA clean
- 5Load wafer cassette200 / 150 mm cassette
- Trench gateSteps 6–12
- 6Hard mask deposition
- 7LithographyTrack + scanner
- 8Trench etch
- 9Resist strip · cleanAshing + wet clean
- 10Sacrificial oxideRepairs trench surface
- 11Gate oxidationFurnace
- 12Poly fill · etch-back
- Body and sourceSteps 13–20
- 13LithographyTrack + scanner
- 14Body implantP-type
- 15Resist strip · cleanAshing + wet clean
- 16Drive-inFurnace
- 17LithographyTrack + scanner
- 18Source implantN⁺
- 19Resist strip · cleanAshing + wet clean
- 20Activation anneal
- Front-side metalSteps 21–30
- 21ILD deposition
- 22LithographyTrack + scanner
- 23Contact etch
- 24Resist strip · cleanAshing + wet clean
- 25Barrier layerTi / TiN
- 26Thick Al depositionSeveral µm
- 27LithographyTrack + scanner
- 28Metal etch
- 29Resist strip · cleanAshing + wet clean
- 30Passivation layerPolyimide
- BacksideSteps 31–35
- 31Temp bond · thinningBackgrinding
- 32Post-grind clean
- 33Backside implantIGBT collector only
- 34Backside laser annealIGBT
- 35Backside metalTi / Ni / Ag
- Wafer testSteps 36–37
- 36Wafer acceptance testWAT: scribe-line tests
- 37Wafer probeCP: per-die test
- ShippingSteps 38–41
- 38Outgoing inspectionLook · defects · data
- 39Into FOSBFOSB
- 40Vacuum dry packBag + desiccant, sealed
- 41Ship to OSATContinues to back end
- ✓ Wafers to the OSAT
Leadframe packages (QFP / SOP)
The classic package: die on a metal leadframe, wire bonded, leads on two or four sides. No solder balls, so no deflux.
39 process steps
Nodes: 90 nm+ | auto MCUs, power ICs, industrial
NewsCar engine and body electronics rely on QFP MCUs — the mature chips missing in the 2021 shortage.
Steps run top to bottom along blue arrows; parallel material lines merge below. Click for details.
- Wafer intakeSteps 1–3
- 1Wafer intakeShipped from the fab
- 2Incoming inspectionIncoming QC
- 3Wafer probeCP, at the fab or OSAT
- Grind & diceSteps 4–10
- 4Apply protective tapeBG tape
- Grinder cleans inline
- 5BackgrindingBack grinding
- 6Post-grind cleanRemoves debris
- 7Detape · tape mountWafer mount
- Saw cleans inline
- 8Wafer dicingWafer saw
- 9Post-dice cleanDI spray + spin dry
- 10Post-dicing inspectionAOI
- Wafer to lineSteps 11–13
- 11Load frame cassetteFrame cassette
- 12N₂ cabinetBy product
- 13To assemblyCart, AGV, or OHT
- Leadframe intakeStep 14
- 14Leadframe intakeLeadframe
- Leadframe to lineSteps 15–16
- 15Load magazineMagazine
- 16To assembly
- Assembly
- Attach & bondSteps 17–23
- 17Kitting · lot matchingMatch lots, count
- 18Plasma before attachBetter adhesion
- 19Die attachEpoxy or DAF
- 20Epoxy cureCure
- 21Plasma before bondCleans pads
- 22Wire bondingWire bond
- 23Post-bond inspection3rd optical
- Mold & form
- MoldingSteps 24–26
- 24MoldingMolding
- 25Post-mold curePMC
- 26DeflashChemical + water jet
- Plating and formingSteps 27–31
- Plating: continuous tanks
- 27Pre-plating treatmentDegrease · pickle · rinse
- 28Lead platingTin plating
- 29Rinse & dry
- 30Laser markingMarking
- 31Trim and formTrim & form
- Plating: continuous tanks
- Test and shipping
- TestSteps 32–34
- 32Final testFT
- 33Burn-in testHigh-reliability
- 34Visual inspectionVisual / AOI
- Packing and shippingSteps 35–39
- 35Trays or reelsQFP trays; SOP tubes/reels
- 36MSL bakeBy MSL
- One inline packer does it all
- 37Vacuum dry packBag + desiccant + HIC
- 38Label · inner box
- 39Carton · pallet
- ✓ Shipped
QFN / DFN (no-lead leadframe)
Leads hidden underneath; the whole strip is molded, then cut (MAP). Wire bonded, no deflux; cleaning is dicing and deflash.
40 process steps
Typical nodes: mature 28 nm and above | power management, analog, RF, Bluetooth chips
NewsPower, charging and wireless chips in phones, earbuds and watches: small, cool, cheap.
Steps run top to bottom along blue arrows; parallel material lines merge below. Click for details.
- Wafer intakeSteps 1–3
- 1Wafer intakeShipped from the fab
- 2Incoming inspectionIncoming QC
- 3Wafer probeCP, at the fab or OSAT
- Grind & diceSteps 4–10
- 4Apply protective tapeBG tape
- Grinder cleans inline
- 5BackgrindingBack grinding
- 6Post-grind cleanRemoves debris
- 7Detape · tape mountWafer mount
- Saw cleans inline
- 8Wafer dicingWafer saw
- 9Post-dice cleanDI spray + spin dry
- 10Post-dicing inspectionAOI
- Wafer to lineSteps 11–13
- 11Load frame cassetteFrame cassette
- 12N₂ cabinetBy product
- 13To assemblyCart, AGV, or OHT
- Leadframe intakeStep 14
- 14Leadframe intakeLeadframe
- Leadframe to lineSteps 15–16
- 15Load magazineMagazine
- 16To assembly
- Assembly
- Attach & bondSteps 17–24
- 17Kitting · lot matchingMatch lots, count
- 18Plasma before attachBetter adhesion
- 19Die attachDie attach
- 20Epoxy cureCure
- 21Plasma before bond
- 22Wire bondingWire bond
- 23Post-bond inspection
- 24Pre-mold plasma cleanBetter mold adhesion
- Mold & singulate
- MoldingSteps 25–27
- 25Strip moldingMAP molding
- 26Post-mold curePMC
- 27DeflashWater jet
- Plating and markingSteps 28–30
- 28Lead platingSkip with PPF
- 29Laser markingMarking
- 30Apply dicing tape
- SingulationSteps 31–32
- Saw cleans inline
- 31SingulationPackage saw
- 32Post-dice cleanDust removal + air dry
- Saw cleans inline
- Test and shipping
- TestSteps 33–35
- 33Final testFT
- 34Burn-in testHigh-reliability
- 35Visual inspectionVisual / AOI
- Packing and shippingSteps 36–40
- 36Tape and reelTape & reel
- 37MSL bakeBy MSL
- One inline packer does it all
- 38Vacuum dry packBag + desiccant + HIC
- 39Label · inner box
- 40Carton · pallet
- ✓ Shipped
Wire-bond BGA (PBGA)
Die face-up on a substrate, wire bonded, solder balls below. Balls need flux, so one deflux.
42 process steps
Nodes: 28 nm+ | consumer SoCs, networking, industrial
NewsDRAM and NAND often stack dies, wire bond them and package as BGA.
Steps run top to bottom along blue arrows; parallel material lines merge below. Click for details.
- Wafer intakeSteps 1–3
- 1Wafer intakeShipped from the fab
- 2Incoming inspectionIncoming QC
- 3Wafer probeCP, at the fab or OSAT
- Grind & diceSteps 4–10
- 4Apply protective tapeBG tape
- Grinder cleans inline
- 5BackgrindingBack grinding
- 6Post-grind cleanRemoves debris
- 7Detape · tape mountWafer mount
- Saw cleans inline
- 8Wafer dicingWafer saw
- 9Post-dice cleanDI spray + spin dry
- 10Post-dicing inspectionAOI
- Wafer to lineSteps 11–13
- 11Load frame cassetteFrame cassette
- 12N₂ cabinetBy product
- 13To assemblyCart, AGV, or OHT
- Substrate intakeStep 14
- 14Substrate in · bakeRemoves moisture
- Substrate to lineSteps 15–17
- 15Load magazineMagazine
- 16Dry cabinet storageBy product
- 17To assembly
- Assembly
- Attach & bondSteps 18–24
- 18Kitting · lot matchingMatch lots, count
- 19Plasma before attachBetter adhesion
- 20Die attachDie attach
- 21Epoxy cureCure
- 22Plasma before bond
- 23Wire bondingWire bond
- 24Pre-mold plasma clean
- Mold & ball mount
- MoldingSteps 25–27
- 25MoldingMolding
- 26Post-mold curePMC
- 27Laser markingMarking
- Ball mountSteps 28–32
- 28Plasma before ballsBy product
- Inline ball mount
- 29Flux applicationFlux
- 30Ball mountBall mount
- 31ReflowReflow
- 32Post-ball-mount defluxFlux around balls
- SingulationSteps 33–34
- Cleaned right after dicing
- 33SingulationSingulation
- 34Post-dice clean
- Cleaned right after dicing
- Test and shipping
- TestSteps 35–37
- 35Final testFT
- 36Burn-in testHigh-reliability
- 37Visual inspectionVisual / AOI
- Packing and shippingSteps 38–42
- 38Into traysJEDEC tray
- 39MSL bakeBy MSL
- One inline packer does it all
- 40Vacuum dry packBag + desiccant + HIC
- 41Label · inner box
- 42Carton · pallet
- ✓ Shipped
Flip-chip BGA (FCBGA / FCCSP)
Die flipped and bumped onto the substrate, then underfilled. Same data as the deflux article. FCCSP is the small version, often with molded underfill.
55 process steps
Typical nodes: 40 nm to 3 nm | CPUs, GPUs, network switch chips; high-end products mostly 7 nm and below
NewsCPUs, GPUs and switch chips are all flip chip — too many pins and too much power for wires.
Steps run top to bottom along blue arrows; parallel material lines merge below. Click for details.
- Wafer intakeSteps 1–2
- 1Wafer intakeShipped from the fab
- 2Incoming inspectionIncoming QC
- BumpingSteps 3–8
- 3Pre-bump plasma descumDescum
- 4Bump formationPI · UBM · plate · reflow
- 5Bump plating cleansPre-treat + rinse
- 6Post-strip cleanAfter strip & etch
- 7Post-bump-reflow cleanWafer-level tools
- 8Wafer probeCP
- Grind & diceSteps 9–15
- 9Apply protective tapeBG tape
- Grinder cleans inline
- 10BackgrindingBack grinding
- 11Post-grind cleanRemoves debris
- 12Detape · tape mountWafer mount
- Saw cleans inline
- 13Wafer dicingWafer saw
- 14Post-dice cleanDI spray + spin dry
- 15Post-dicing inspectionAOI
- Wafer to lineSteps 16–18
- 16Load frame cassetteFrame cassette
- 17N₂ cabinetBy product
- 18To assemblyCart, AGV, or OHT
- Substrate intakeStep 19
- 19Substrate in · bake
- Panel depanelingSteps 20–21
- Cleaned right after depaneling
- 20Panel depanelingRouter, quarter panels
- 21Post-depaneling cleanDust removal
- Cleaned right after depaneling
- Component mountingSteps 22–23
- Inline SMT
- 22SMT passivesFlux · reflow
- 23Pad defluxRemoves flux from pads
- Inline SMT
- Substrate to lineSteps 24–26
- 24Load magazineMagazine
- 25Dry cabinet storageBy product
- 26To assembly
- Flip-chip assembly
- BondingSteps 27–31
- 27Kitting · lot matchingMatch lots, count
- Inline flip chip: conveyor to cleaner
- 28Flux dip / sprayFlux
- 29Flip-chip attachFlip chip attach
- 30ReflowReflow
- 31Post-flip-chip defluxCritical: flux in the gap
- UnderfillSteps 32–35
- 32BakeBake
- 33Plasma before underfillBetter flow & adhesion
- 34UnderfillUnderfill
- 35Underfill cureCure
- Finishing
- ProtectionSteps 36–40
- 36MoldingMolding
- 37Post-mold cleanFlash & dust (molded)
- 38Pre-lid plasma cleanBy product
- 39Lid attachLid attach + TIM
- 40Laser markingMarking
- Ball mountSteps 41–44
- 41Plasma before ballsBy product
- Inline ball mount
- 42Flux · ball mountBall mount
- 43ReflowReflow
- 44Post-ball-mount deflux
- SingulationSteps 45–46
- Cleaned right after dicing
- 45SingulationUnit saw
- 46Post-dice cleanDust removal
- Cleaned right after dicing
- Test and shipping
- TestSteps 47–50
- 47Final testFT
- 48Burn-in testBurn-in
- 49System-level testSLT, high-end chips
- 50Visual inspection
- Packing and shippingSteps 51–55
- 51Into traysJEDEC tray
- 52MSL bakeBy MSL
- One inline packer does it all
- 53Vacuum dry packBag + desiccant + HIC
- 54Label · inner box
- 55Carton · pallet
- ✓ Shipped
Wafer-level chip scale package (WLCSP)
Packaged on the whole wafer; each unit is die-sized. No substrate, so one line and no merge. All cleaning at wafer level.
32 process steps
Typical nodes: mostly mature 28 nm and above | small dies for power management, sensors, RF
NewsMany tiny power, sensor and RF chips in phones are WLCSP — the package is the chip.
Steps run top to bottom along blue arrows; parallel material lines merge below. Click for details.
- Wafer line
- Wafer intakeSteps 1–2
- 1Wafer intakeShipped from the fab
- 2Incoming inspectionIncoming QC
- RedistributionSteps 3–15
- 3Passivation 1PI/PBO litho & cure
- 4Passivation descumDescum
- 5Seed layer sputterSeed sputter
- 6Litho
- 7Pre-RDL treat
- 8RDL platingRDL Cu plating
- 9Post-RDL-plating rinse
- 10Strip · seed etchWet process
- 11Post-strip clean
- 12Passivation 2PI
- 13Passivation descumDescum
- 14Pre-UBM plasma clean
- 15UBMUBM
- Ball mountSteps 16–18
- Inline ball mount (wafer)
- 16Flux print · ball dropBall drop
- 17ReflowReflow
- 18Wafer-level defluxFlux around balls
- Inline ball mount (wafer)
- Grind & diceSteps 19–26
- 19Wafer probeCP
- Grinder cleans inline
- 20BackgrindingBack grinding
- 21Post-grind cleanRemoves debris
- 22Backside filmBackside laminate
- 23Laser markingMarking
- Saw cleans inline
- 24Wafer dicingWafer saw
- 25Post-dice clean
- 26Visual inspectionAOI
- Pick-and-testSteps 27–28
- 27Pick to reelPick & place
- 28Final testBy product
- Packing and shippingSteps 29–32
- 29MSL bakeBy MSL
- One inline packer does it all
- 30Vacuum dry packBag + desiccant + HIC
- 31Label · inner box
- 32Carton · pallet
- ✓ Shipped
Fan-out packaging (Fan-out / InFO)
Dies placed on a carrier and molded, then RDL fans connections out beyond the die. Chip-first shown; TSMC InFO is this type.
46 process steps
Typical nodes: advanced 16 nm and below | phone processors (the first volume product was Apple's 16 nm A10)
NewsTSMC first used InFO for the iPhone 7's A10 in 2016 (Semiconductor Digest) — thinner and cooler; later iPhones kept it.
Steps run top to bottom along blue arrows; parallel material lines merge below. Click for details.
- Wafer intakeSteps 1–3
- 1Wafer intakeShipped from the fab
- 2Incoming inspectionIncoming QC
- 3Wafer probeCP, at the fab or OSAT
- Copper pillar growthSteps 4–5
- 4Wafer copper postsCu post
- 5Cu post cleansPre-treat · rinse · strip
- Grind & diceSteps 6–12
- 6Apply protective tapeBG tape
- Grinder cleans inline
- 7BackgrindingBack grinding
- 8Post-grind cleanRemoves debris
- 9Detape · tape mountWafer mount
- Saw cleans inline
- 10Wafer dicingWafer saw
- 11Post-dice cleanDI spray + spin dry
- 12Post-dicing inspectionAOI
- Wafer to lineSteps 13–15
- 13Load frame cassetteFrame cassette
- 14N₂ cabinetBy product
- 15To assemblyCart, AGV, or OHT
- Carrier preparationSteps 16–19
- 16Carrier release coatCarrier + release
- 17Backside RDLBackside RDL, for PoP
- 18Through-mold viasTIV / TMV, for PoP
- 19Post-TMV-plating cleanFor PoP
- Carrier to lineStep 20
- 20To assembly
- Place & mold
- Place & moldSteps 21–25
- 21Kitting · lot matchingMatch lots, count
- 22Die placementFace-up + DAF
- 23Compression moldingCompression molding
- 24Mold grindingExpose Cu posts
- 25Post-grind cleanRemoves residue
- RDL & balls
- RedistributionSteps 26–29
- 26Multilayer RDLRepeat several layers
- 27RDL descum (repeated)After each develop
- 28Per-layer RDL cleanPlating and strip
- 29UBMUBM
- Ball mountSteps 30–32
- Inline ball mount (wafer)
- 30Flux · ball mountBall mount
- 31ReflowReflow
- 32Wafer-level deflux
- Inline ball mount (wafer)
- Debond & singulate
- Debond and singulationSteps 33–38
- 33Carrier debondCarrier debond
- 34Post-debond cleanRemoves adhesive
- 35Backside open · stackFor PoP
- 36Laser markingMarking
- Saw cleans inline
- 37SingulationSaw
- 38Post-dice clean
- Test and shipping
- TestSteps 39–41
- 39Final testFT
- 40Burn-in testHigh-reliability
- 41Visual inspectionVisual / AOI
- Packing and shippingSteps 42–46
- 42Into traysJEDEC tray
- 43MSL bakeBy MSL
- One inline packer does it all
- 44Vacuum dry packBag + desiccant + HIC
- 45Label · inner box
- 46Carton · pallet
- ✓ Shipped
CoWoS (2.5D advanced packaging)
Three inputs: interposer wafers and compute chips (from fabs) and HBM (from memory makers). They merge on the interposer (CoW), then the module meets the substrate (oS). Two flip-chip bonds plus balls: at least three defluxes. CoWoS-S shown, from public sources.
73 process steps
Typical nodes: mainly 7 nm and below | AI accelerators: NVIDIA H100 (4 nm class), B200, B300 (4NP); first volume production was a 28 nm FPGA in 2013
In the newsAI accelerators from the NVIDIA H100 and B200 (TechInsights) to the latest B300 (Blackwell Ultra, CoWoS-L, HBM3E in 12-high stacks for 288 GB; TrendForce) all use CoWoS to package the GPU and HBM memory together. With AI demand surging, CoWoS capacity has become the bottleneck for AI chip shipments (AI Weekly).
Steps run top to bottom along blue arrows; parallel material lines merge below. Click for details.
- InterposerSteps 1–6
- 1Through-silicon viasTSV etch · fill · CMP
- 2Post-CMP clean
- 3Front-side RDLInterposer RDL
- 4RDL descum (repeated)Descum
- 5Per-layer RDL cleanPlating and strip
- 6Micro-bump padsMicro-bump pad
- Interposer to lineSteps 7–8
- 7Load into FOUPFOUP
- 8To assemblyOHT or AGV
- Micro-bumpsSteps 9–11
- 9SoC wafer micro-bumpsMicro-bump
- 10Micro-bump cleansPre-treat · rinse · strip
- 11Wafer probeCP, pick KGD
- Grind & diceSteps 12–15
- Grinder cleans inline
- 12Grinding
- 13Post-grind cleanRemoves debris
- Saw cleans inline
- 14Dicing
- 15Post-dice clean
- Grinder cleans inline
- Wafer to lineSteps 16–18
- 16Load frame cassetteFrame cassette
- 17N₂ cabinetBy product
- 18To assemblyCart, AGV, or OHT
- HBMStep 19
- 19HBM stack intakePre-stacked memory
- HBM to lineSteps 20–21
- 20Unpack · dry cabinet
- 21To assembly
- Substrate intakeStep 22
- 22Substrate in · bake
- Substrate to lineSteps 23–25
- 23Load magazineMagazine
- 24Dry cabinet storageBy product
- 25To assembly
- CoW
- CoW bondingSteps 26–29
- 26Kitting · lot matchingMatch lots, count
- CoW bonding: inline with reflow
- 27Flux applicationFlux
- 28Chip bondingReflow or TCB
- 29CoW defluxHardest: <25 µm bumps
- Underfill and moldingSteps 30–36
- 30Bake
- 31Plasma before underfill
- 32UnderfillUnderfill
- 33Underfill cureCure
- 34Wafer-level moldingWafer molding
- 35Mold grinding
- 36Post-grind clean
- Interposer back
- Backside and dicingSteps 37–48
- 37Temporary carrier bondTemporary bond
- 38Backgrind · TSV revealTSV reveal
- 39Post-reveal clean
- 40Backside passivation · RDL
- 41Backside RDL cleanPlating and strip
- 42C4 bumpsPlating + reflow
- 43Post-bump cleanBy process
- 44Carrier debondDebond
- 45Post-debond cleanRemoves adhesive
- Saw cleans inline
- 46CoW dicingWafer saw
- 47Post-dice clean
- 48CoW test
- To oS lineSteps 49–50
- 49Load trays
- 50To assembly
- oS
- oS bondingSteps 51–55
- 51Kitting · lot matchingMatch lots, count
- Inline flip chip: conveyor to cleaner
- 52Flux applicationFlux
- 53Flip-chip bondingCoW on substrate
- 54ReflowReflow
- 55oS defluxLarge size, narrow gap
- Underfill and lidSteps 56–61
- 56Bake
- 57Plasma before underfill
- 58UnderfillUnderfill
- 59Underfill cureCure
- 60Pre-lid plasma cleanBy product
- 61Lid · stiffenerLid / stiffener + TIM
- Balls & test
- Ball mountSteps 62–65
- 62Plasma before ballsBy product
- Inline ball mount
- 63Flux · ball mountBall mount
- 64ReflowReflow
- 65Post-ball-mount deflux
- TestSteps 66–68
- 66Final testFT
- 67System-level testSLT
- 68Visual inspection
- Packing and shippingSteps 69–73
- 69Into traysJEDEC tray
- 70MSL bakeBy MSL
- One inline packer does it all
- 71Vacuum dry packBag + desiccant + HIC
- 72Label · inner box
- 73Carton · pallet
- ✓ Shipped
CoPoS (panel 2.5D, in development)
Swaps CoWoS's round interposer for a 310×310 mm panel — reportedly a square CoWoS-L/R. Same merges as CoWoS. Not yet in production; expected flow from public info. More: What is CoPoS.
58 process steps
Typical nodes: expected to be the most advanced, 3 nm and below | large AI / HPC chips (after 2028)
NewsTSMC's CoPoS pilot line is at VisEra Longtan in 2026, with volume at AP7 Chiayi after 2H 2028 (Economic Daily News, T Kebang). See What is CoPoS.
Steps run top to bottom along blue arrows; parallel material lines merge below. Click for details.
- Panel interposerSteps 1–7
- 1Panel carrier310×310 mm carrier
- 2Release layer coatRelease layer
- 3Multilayer RDLPanel RDL
- 4RDL descum (repeated)Descum
- 5Per-layer RDL cleanPlating and strip
- 6Silicon bridgesLSI, CoWoS-L style
- 7Micro-bump pads
- Interposer to lineSteps 8–9
- 8Load into FOUPFOUP
- 9To assemblyOHT or AGV
- Micro-bumpsSteps 10–11
- 10SoC bumps · probeKGD
- 11Micro-bump cleansPre-treat · rinse · strip
- Grind & diceSteps 12–15
- Grinder cleans inline
- 12Grinding
- 13Post-grind cleanRemoves debris
- Saw cleans inline
- 14Dicing
- 15Post-dice clean
- Grinder cleans inline
- Wafer to lineSteps 16–18
- 16Load frame cassetteFrame cassette
- 17N₂ cabinetBy product
- 18To assemblyCart, AGV, or OHT
- HBMStep 19
- 19HBM stack intake
- HBM to lineSteps 20–21
- 20Unpack · dry cabinet
- 21To assembly
- Substrate intakeStep 22
- 22Substrate in · bake
- Substrate to lineSteps 23–25
- 23Load magazineMagazine
- 24Dry cabinet storageBy product
- 25To assembly
- CoP
- CoP bondingSteps 26–29
- 26Kitting · lot matchingMatch lots, count
- CoP bonding: panels suit conveyors
- 27Flux applicationFlux
- 28Chip bondingChip on panel
- 29Panel-level defluxEven across 310 mm
- Underfill and moldingSteps 30–36
- 30BakeFull-panel drying
- 31Plasma before underfill
- 32UnderfillUnderfill
- 33Underfill cure
- 34Panel moldingPanel molding
- 35Mold grinding
- 36Post-grind clean
- Panel back & dicing
- Backside and dicingSteps 37–42
- 37Carrier debondDebond
- 38Post-debond cleanRemoves adhesive
- 39C4 bumps
- 40Post-bump cleanBy process
- Saw cleans inline
- 41Panel dicingPanel saw
- 42Post-dice clean
- To oS lineSteps 43–44
- 43Load trays
- 44To assembly
- oS and back end
- oS bondingSteps 45–49
- 45Kitting · lot matchingMatch lots, count
- Inline flip chip
- 46Flip-chip to substrateSame as CoWoS
- 47oS Deflux
- 48Plasma before underfill
- 49Underfill · lid
- Ball mountSteps 50–52
- 50Plasma before ballsBy product
- Inline ball mount
- 51Ball mount · reflow
- 52Post-ball-mount deflux
- TestStep 53
- 53Final test · SLT
- Packing and shippingSteps 54–58
- 54Into traysJEDEC tray
- 55MSL bakeBy MSL
- One inline packer does it all
- 56Vacuum dry packBag + desiccant + HIC
- 57Label · inner box
- 58Carton · pallet
- ✓ Shipped
FAQ
What is the order of semiconductor manufacturing?
There are roughly three stages. First, a wafer maker grows crystals, slices, and polishes them into blank wafers. Next, a fab does front-end processing, repeating deposition, lithography, etching, ion implantation, and CMP to build transistors and more than ten layers of metal interconnect, followed by wafer test. Finally, the wafers go to an OSAT for back-end processing: grinding, dicing, die attach, wire bonding or flip chip, molding, and testing before shipment.
What's the difference between front-end and back-end processing?
The front end happens in the fab on whole wafers, building circuits at nanometer scale. The back end happens at the OSAT on diced chips, connecting them to external circuits, encapsulating them for protection, and testing them, at micron-to-millimeter scale.
Is crystal growth part of front-end processing?
No. Crystal growth is a materials process that makes the wafer itself, handled by wafer makers, and sits upstream in the supply chain as materials. Front-end processing starts once the fab receives polished wafers.
What are FEOL, MOL, and BEOL? Are they the same as back-end processing?
These are divisions inside the fab: FEOL builds transistors, MOL builds contacts, and BEOL builds metal interconnect, all part of front-end processing. Although BEOL stands for "back end of line," it isn't the same as back-end packaging at an OSAT, which is easy to confuse.
What are the upstream, midstream, and downstream segments of the semiconductor industry?
This is a supply-chain view: upstream is IC design and materials such as silicon wafers, midstream is wafer fabrication, and downstream is packaging and test. So wafer fabrication is "midstream" in the supply chain and "front end" in the process flow; the two terms refer to the same thing.
How many process steps does a chip go through?
It depends on the product. In the general flows compiled on this site, crystal growth has about 34 steps, front-end processing for advanced logic about 67 (the metal interconnect section repeats more than ten times, so in practice it's several hundred), and CoWoS packaging about 73. A real fab's complete flow often exceeds a thousand steps, and most of it is confidential.
Further reading
Sag trips on your line?
An ingot takes days, a lot holds 25 wafers, an OSAT holds whole batches — one sag can scrap them. The VSP guards controls, switching in 1 ms. See also SEMI F47.
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